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Helsinki, June 28 - July 2, 2004
We thank all attendees who made the conference
a great success and hope to see you again in Richland, Washington, USA
for the Cosires 2006 chaired by Bill Weber, Rene Corrales, Howard Heinisch,
Fei Gao and Ram Devanathan.
COSIRES 2006 will be held in Richland, WA (USA) from June 18
(Registration) through June 23, 2006.
COSIRES 2006 web page
The conference is now over, but these web pages will
remain open for some time to come for reference by future
organizers.
Conference pictures
Proceedings table of contents [PDF]
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COSIRES 2004 is the 7th International
Conference on Computer Simulation of Radiation Effects in Solids.
This series of conferences addresses the development and application of
advanced computer simulation techniques to the study of the interaction
of energetic particles (from several eV to some MeV) with solids. Due to
the permanent increase of computer power this research field is growing
fast. The application of computer simulations leads to a better understanding
of basic microscopic mechanisms during and after irradiation. Such processes
are often not accessible by experimental methods since they occur on very
small time and length scales. The computer simulation techniques are not
only used for investigations of basic phenomena but also increasingly applied
in the development of advanced industrial technologies. Conference topics
include, but are not limited to, the following:
Computational modeling of
- Ion- and plasma-induced physical and chemical effects at surfaces and interfaces
- Formation and evolution of radiation defects in metals, ceramics and carbon-based materials
- Doping of semiconductors using ion implantation and subsequent annealing
- Ion beam synthesis of nanostructures
- Formation of thin films by ion- and plasma-assisted deposition
Progress in the development of simulation techniques
- Ab-initio, atomistic, and mesoscopic methods
- Combination of different simulation methods, multi-scale computer simulation
- Development of simulation techniques for ion beam analysis
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